- Huge refactoring for IC
- Update hash combination logic
- Introduce value class for IC hashes
- Calc md5 directly by function IR
- Split IC logic by classes
- Move JsIrLinkerLoader into separate file
- CacheUpdateStatus is a sealed class
- Render TYPE_PARAMETER reified flag
^KT-51081 Fixed
^KT-51084 Fixed
- Cache signature readers and deserializers
- Cache inline function hashes
- IC refactoring
- [gradle] Use hash of module path for cache dir; Fix KT-51238
^KT-51238 Fixed
- Output ES modules instead of plain files
- Support -Xwasm-launcher=d8 for d8 shell used in tests and benchmarks.
- Reuse launcher generation logic in CLI and box tests runners.
- Create separate output directory for each box since
there are multiple output files generated for each test.
- Stop using absolute paths in generate JS files
to simplify running generated code on different machine
- Remove ">>>" from println output
Merge-request: KT-MR-5729
Merged-by: Svyatoslav Kuzmich <svyatoslav.kuzmich@jetbrains.com>
[JS IR] Fix compilation in tests
[JS IR] Fix test after migrating IC to compiler
[JS IR] Fix memory leak
[JS IR] Move js ic to compiler
Merge-request: KT-MR-5673
Merged-by: Ilya Goncharov <Ilya.Goncharov@jetbrains.com>
Previously IC state was stored in System properties. As result parallel
compilation might cause incorrect state of IC, what led to corruption
of kotlin_module files. Now IC state is stored via CompilerArguments
and CompilerConfiguration
#KT-46038 Fixed
Compute library md5 hash and check it first with cached one. If hashes
are equal it means that cache is up-to-date and no additional checks are
needed
- store library hashes (flat + trans) into cache info file
- change invalidator return value
* Use fetch and instantiateStreaming
* Call main export if it is present
* Produce a variable with module name that contains a
promise of module exports
- change test runner to production mode when sources are being compiled
into klib and then klib is being translated into js, not directly from
kt to js
- fix IC cache format
- support IC tests